Search results for "Dynamic testing"

showing 10 items of 12 documents

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

2020

International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.

010302 applied physicsMaterials science010308 nuclear & particles physicsNuclear engineering01 natural sciencesNeutron temperature[SPI.TRON]Engineering Sciences [physics]/Electronics0103 physical sciences[INFO.INFO-ES]Computer Science [cs]/Embedded SystemsNeutronIrradiation[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDramBlock (data storage)Dynamic testing2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
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A new large scale laboratory: The LEDA research centre (Laboratory of Earthquake engineering and Dynamic Analysis)

2017

Recently, the field of earthquake engineering experienced substantial enhancements due to numerous results of experimental and theoretical researches. Modern technical codes recognized the last advances in this field and provided new solutions for the structural assessment and design of buildings. However, the need for large scale testing is still taking several open questions, especially for the design of civil infrastructures, and experimental activity on full scale specimens has become necessary. This paper presents the main testing facilities of a new research centre, namely the Laboratory of Earthquake engineering and Dynamic Analysis (LEDA) of the University of Enna “Kore”. In particu…

Dynamic testing Earthquake engineering Experimental Large scale testing Pseudo-dynamic testing
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The reaction structure of the LEDA research centre: Development and design

2017

In the last twenty years, the field of earthquake engineering experienced a noticeable improvement. The results of experimental and theoretical researches have contributed to the development of modern technical codes, which provide innovative solutions for the structural assessment and new design approaches. Despite this large amount of improvements, several open questions are still open, and the need for large scale testing has been deeply proved and discussed. A new research facility, namely the Laboratory of Earthquake engineering and Dynamic Analysis (LEDA), has been recently completed at the University of Enna "Kore". This research centre, funded with a grant from Italian Ministry of E…

ExperimentalEarthquake engineeringLarge scale testingPseudo-dynamic testingBuilding and ConstructionSafety Risk Reliability and QualityGeotechnical Engineering and Engineering Geology
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Frequency domain identification of the fractional Kelvin-Voigt’s parameters for viscoelastic materials

2019

Abstract In this work, a new innovative method is used to identify the parameters of fractional Kelvin-Voigt constitutive equation. These parameters are: the order of fractional derivation operator, 0 ≤ α ≤ 1, the coefficient of fractional derivation operator, CV, and the stiffness of the model, KV. A particular dynamic test setup is developed to capture the experimental data. Its outputs are time histories of the excitation and excited accelerations. The investigated specimen is a polymeric cubic silicone gel material known as α-gel. Two kinds of experimental excitations are used as random frequencies and constant frequency harmonic excitations. In this study, experimental frequency respon…

Frequency responseMaterials scienceOperator (physics)Constitutive equationMathematical analysis02 engineering and technology021001 nanoscience & nanotechnologyViscoelasticity020303 mechanical engineering & transports0203 mechanical engineeringMechanics of MaterialsFrequency domainHarmonicGeneral Materials ScienceTime domain0210 nano-technologyInstrumentationDynamic testingMechanics of Materials
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Neutron-Induced Effects on a Self-Refresh DRAM

2022

International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under neutron irradiation. The neutron-induced effects were investigated and characterised by event cross sections, soft-error rate, and bitmaps evaluations, leading to an identification of permanent and temporary stuck cells, single-bit upsets, and block errors. Block errors were identified in different patterns with dependency in the addressing order, leading to up to two thousand faulty words per event, representing a real threat fr…

HyperRAMComputer science020209 energykäyttömuistitSelf-Refresh02 engineering and technologyNeutronFault (power engineering)elektroniikkakomponentit0202 electrical engineering electronic engineering information engineering0601 history and archaeologyElectrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSafety Risk Reliability and QualitySimulationhiukkassäteilyBlock (data storage)060102 archaeologyEvent (computing)stuck bitsneutronit06 humanities and the artscomputer.file_formatCondensed Matter PhysicsSelf-refreshAtomic and Molecular Physics and OpticsSEESurfaces Coatings and FilmsElectronic Optical and Magnetic Materials[SPI.TRON]Engineering Sciences [physics]/ElectronicsradiationIdentification (information)DRAMsäteilyfysiikkaStuck bitsBitmapNode (circuits)[INFO.INFO-ES]Computer Science [cs]/Embedded SystemscomputerDramDynamic testing
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Soft errors in commercial off-the-shelf static random access memories

2016

International audience; This article reviews state-of-the-art techniques for the evaluation of the effect of radiation on static random access memory (SRAM). We detailed irradiation test techniques and results from irradiation experiments with several types of particles. Two commercial SRAMs, in 90 and 65 nm technology nodes, were considered as case studies. Besides the basic static and dynamic test modes, advanced stimuli for the irradiation tests were introduced, as well as statistical post-processing techniques allowing for deeper analysis of the correlations between bit-flip cross-sections and design/architectural characteristics of the memory device. Further insight is provided on the …

ImaginationDynamic test modeComputer sciencemedia_common.quotation_subject01 natural sciencesParticle detector[SPI]Engineering Sciences [physics]0103 physical sciencesMaterials ChemistryElectronic engineeringStatic random-access memoryElectrical and Electronic EngineeringLayer (object-oriented design)Ionizing Particlesmedia_common010302 applied physics[PHYS]Physics [physics]010308 nuclear & particles physicsDetectorCondensed Matter PhysicsSRAMBit mappingElectronic Optical and Magnetic MaterialsStatic test modeMarch testParticle detectorCommercial off-the-shelfRandom accessDynamic testing
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Methodologies for the Statistical Analysis of Memory Response to Radiation

2016

International audience; Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65 nm SRAM irradiated with neutrons, protons and heavy ions. This publication is an extended version of a previous study.

Nuclear and High Energy PhysicsEngineeringHardware_PERFORMANCEANDRELIABILITYRadiation[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]01 natural sciencesstatistical analysis0103 physical sciencesStatic testingElectronic engineeringmemory responseStatistical analysisSensitivity (control systems)Static random-access memoryElectrical and Electronic Engineeringstatic testCluster of bit-flipsdynamic test010302 applied physicsSingle event upset SEURandom access memoryta114ta213010308 nuclear & particles physicsbusiness.industrymultiple cell upset (MCU)säteilySRAMReliability engineeringradiationNuclear Energy and EngineeringSingle event upsetradiation effectsbusiness[MATH.MATH-NA]Mathematics [math]/Numerical Analysis [math.NA]Dynamic testing
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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

2015

International audience; Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Nuclear and High Energy PhysicsEngineeringcomputer.software_genreUpsetCross section (physics)Static testingCluster of bit flipsStatic random-access memoryElectrical and Electronic Engineeringradiation testingstatic testCluster analysisdynamic test[PHYS]Physics [physics]single event upset (SEU)ta213ta114Cross sectionbusiness.industrySEFImultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRAMRadiation testingMicrocontrollerMCUNuclear Energy and EngineeringSEU clusterData miningbusinesscomputerDynamic testing
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Base-isolated structure equipped with tuned liquid column damper: An experimental study

2019

Abstract In this study, a novel passive vibration control strategy is investigated experimentally, where a Tuned Liquid Column Damper protects a base-isolated structure. The Tuned Liquid Column Damper is attached to the base, in contrast to typical attachment points of passive energy dissipation devices in high-rise buildings at elevated levels. Experiments on a base-excited small-scale three-story shear frame are conducted in order to study effects of both control devices – base-isolation and Tuned Liquid Column Damper – on the structural model. The dynamic properties of the stand-alone shear frame and the base-isolation subsystem are derived using standard dynamic test methods based on di…

Optimal designOptimal design0209 industrial biotechnologyMaterials scienceAcousticsVibration controlAerospace Engineering02 engineering and technology01 natural sciencesTransfer functionDisplacement (vector)DamperAcceleration020901 industrial engineering & automation0103 physical sciencesTuned liquid column damper010301 acousticsCivil and Structural EngineeringMechanical EngineeringDissipationHybrid control strategyBase-isolated structureComputer Science ApplicationsControl and Systems EngineeringSmall-scale experimentSignal ProcessingDynamic testingMechanical Systems and Signal Processing
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Dynamic Test Methods for COTS SRAMs

2014

International audience; In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmos…

Pseudorandom number generatorsingle event upset (SEU)Nuclear and High Energy Physicsta114ta213Computer scienceCOTSneutrons65 nmmultiple cell upset (MCU)SRAMColumn (database)[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation testingNuclear Energy and EngineeringElectronic engineering90 nmHeavy ionStatic random-access memoryElectrical and Electronic Engineeringheavy ionsNeutron irradiationWord (computer architecture)dynamic testDynamic testingIEEE Transactions on Nuclear Science
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